Yves Ménesguen was born in 1979. He graduated from l’Ecole Supérieure d’Electricité and
received the Ph.D. degree from University Paris VI, Paris, France in 2006. He is currently
working at the CEA/LNHB since 2009, the French metrology institute for ionizing radiations.
His interests in X-rays started with the evaluation and new methods to assess for reliable X-
ray fundamental parameters that are commonly used for quantification (mass attenuation
coefficients, fluorescence yields, optical indices). The applications developed at the LNHB
includes X-ray reflectivity to be combined with X-ray fluorescence (GIXRF) to quantify
nanolayers.
