The Workshop will focus on the physics of nanometer-scale multilayer films optimized for various applications in the Extreme Ultraviolet (EUV) and X-ray domains as well as neutron optics. The main topics that will be discussed include:
- Multilayer X-Ray and Neutron Optics
- Multilayer Design and Modeling
- Film Growth and Microstructure
- Roughness and Interface Formation
- Surface and Thin-Film Modifications using Ion Beams
- Film Removal Techniques
- Growth Models and Computer Simulations
- X-Ray and Neutron Scattering
- Surface and Interface Topography
- Layer and Interface Composition
- Wavefront Characterization and Correction
- Mechanical Properties and Stability
- Optical Properties
- Novel Characterization Techniques
- Polarization Control
- Metrology